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Testing Significance of Layout Dependent Impacts on Silicon Chips Performance
Abstract:
Layout Dependent Effects (LDE) play a vital role in the layout of analog and digital circuits. These effects directly affect the performance of the integrated circuits. If you do not pay any attention to the layout-dependent effects, then there is less chance of getting the proper performance of the chips. There are many layout-dependent effects such as Shallow Trench Isolation (STI), Length of Diffusion (LoD), Poly and Diffusion spacing, Well Proximity Effect (WPE), etc. In this paper, more attention is given to the above topics. Engineers typically must perform a variety of checks that cover these and related layout issues to ensure analog layout consistency.
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